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T3L: A Practical Implementation of Tri-Transistor Ternary Logic Based on Inkjet-Printed Anti-Ambipolar Transistors and CMOSs of Thin-Film Structure
- Kim, Jongbeom;
- Lee, Hyundong;
- Ko, Jonghyun;
- Kim, Bongjun;
- Song, Taigon
SCOPUS
2초록
The imminent rise in data consumption and the physical constraints of current advanced CMOS scaling hasten the end of the projection to the binary system. For a breakthrough of these issues, the ternary system, known for its superior efficiency in expressing numbers (closest to e≈~2.7183 ) has garnered considerable attention. Among the ternary studies reported, the anti-ambipolar transistor (AAT) is acquiring attention thanks to its unique negative differential resistance (NDR) and anti-ambipolar characteristics (AAC). Moreover, easy-to-fabricate inkjet-printing based AAT was introduced. Therefore, in this paper, we propose a practical design methodology (T3L: The Tri-transistor Ternary Logic') and a set of novel ternary logic based on inkjet-printed AATs and CMOSs. In detail, 1) We propose balanced ternary full adders (BTFA) and prove that inkjet-printed AATs and CMOSs are highly capable of implementing any kind of ternary logic. 2) We propose two design methodologies for ternary logic design: NDR-based Design Method I and AAC-based Design Method II. 3) We present optimization methodology for inkjet-printed ternary circuit stability and provide circuitry to secure sufficient noise margin. We provide a highly-compact BTFA design that requires only 64 transistors and an ultra-low-power BTFA design that reduces power by 84.7% to 98.8% compared to the previous designs. © 2004-2012 IEEE.
키워드
- 제목
- T3L: A Practical Implementation of Tri-Transistor Ternary Logic Based on Inkjet-Printed Anti-Ambipolar Transistors and CMOSs of Thin-Film Structure
- 저자
- Kim, Jongbeom; Lee, Hyundong; Ko, Jonghyun; Kim, Bongjun; Song, Taigon
- 발행일
- 2023
- 유형
- Article
- 권
- 70
- 호
- 12
- 페이지
- 4826 ~ 4839
- 언어
- ENG
- 출판사
- Institute of Electrical and Electronics Engineers Inc.
- 발행국가
- 미국
- 분량
- 14 페이지
- ISSN
- E 1558-0806
P 1549-8328