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A Novel Framework for Optical Layer Device Board Failure Localization in Optical Transport Network
- Jiao, Yan;
- Ho, Pin-Han;
- Lu, Xiangzhu;
- Tapolcai, Janos;
- Peng, Limei
WEB OF SCIENCE
3SCOPUS
7초록
This paper presents a novel framework called Failure-Alarm Correlation Tree based Failure Localization (FACT-FL), designed to localize failed optical layer device boards in an Optical Transport Network (OTN). Specifically, FACT-FL aims to construct a set of FACTs by correlating the failed boards and alarms, where each FACT takes one failed board and its correlated alarms as the root and leaves, respectively. Furthermore, a FACT consists of a suite of kth order Failure-Alarm Correlation Chains (k-FACCs) with different order values of k. Each k-FACC indicates the chain-like correlation established by k alarms due to one common failed board. To identify all previously undetected k-FACCs, a set of binary classifiers is trained that characterizes each k-FACC from various dimensions, including time, network topology, traffic distribution, and board/alarm attributes. Eventually, an integer linear programming (ILP) problem is formulated to extract the most likely FACT(s) from those k-FACCs. Extensive case studies demonstrate the superior results of FACT-FL in terms of metrics evaluating the identified failed boards and root alarms. We also analyze its performance under different maximum order values of k and environmental changes, including failure scenarios, network topologies, traffic distributions, and noise alarms.
키워드
- 제목
- A Novel Framework for Optical Layer Device Board Failure Localization in Optical Transport Network
- 저자
- Jiao, Yan; Ho, Pin-Han; Lu, Xiangzhu; Tapolcai, Janos; Peng, Limei
- 발행일
- 2024-10
- 유형
- Article
- 권
- 21
- 호
- 5
- 페이지
- 5374 ~ 5383
- 언어
- ENG
- 출판사
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
- 발행국가
- 미국
- 분량
- 10 페이지
- ISSN
- P 1932-4537