Broadband 1.53 μm Emission and McCumber Analysis of Er3+ Doped Alkali Oxyfluorophosphate Glass for Fiber Optic Communication Material

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초록

Er3+ doped alkali oxyfluorophosphate glasses were prepared by the melted quenching method and characterized their optical and photoluminescence properties. Firstly, the chemical compositions of glasses were varied by changing alkali fluoride (LiF and NaF), whereas the concentration of Er3+ was fixed at 1.00 mol%. The optical absorption pattern and intensity were resemblance. Broadband 1.53 mu m emission was one prominent peak of Er3+ in glass and the highest emission intensity was obtained for NaF glass under the stimulating at 521 nm. Secondly, the NaF glass was prepared by variation of Er3+ concentration (0.1, 0.5, 1.0, 2.0, and 4.0 mol%). The emission intensity of glasses increases with an increase in Er(2)O(3 )concentration up to 2.00 mol% and decreases for higher Er2O3 concentration, because of the concentration quenching effect. Broadband emission was observed that it covers three telecommunication windows: S, C, and L bands. The absorption and emission cross-section of 2.00 mol% of Er(3+ )doped alkali oxyfluorophosphate were found to be 1.3895 x 10(-20) cm(2) and 1.7248 x 10(20) cm(-2) , respectively by using the McCumber theory. Both values led to the estimate of the internal gain coefficient for I-4(13/2) -> I-4(15/2) emission transition. The gain coefficient is positive when P is higher than 40%. All results point out that Er3+ doped alkali oxyfluorophosphate glass could be useful for fiber optic communication material.

키워드

Alkali oxyfluorophosphate glass; Erbium; fiber optic communication material; McCumber theory; SPECTROSCOPIC PROPERTIES; UP-CONVERSION; LUMINESCENCE PROPERTIES; OXYFLUORIDE GLASSES; ENERGY-TRANSFER; PHOSPHATE
제목
Broadband 1.53 μm Emission and McCumber Analysis of Er3+ Doped Alkali Oxyfluorophosphate Glass for Fiber Optic Communication Material
저자
Meejitpaisan, P.; Kim, H. J.; Kaewkhao, J.
DOI
10.1080/10584587.2023.2234614
발행일
2023-11-22
유형
Article
저널명
Integrated Ferroelectrics
권
239
호
1
페이지
104 ~ 119