Muon tagging with flash ADC waveform baselines

Lee, D. H.; Cheoun, M. K.; Choi, J. H.; Choi, J. Y.; Dodo, T.; Goh, J.; Harada, M.; Hasegawa, S.; Hwang, W.; Iida, T.; Jang, H. I.; Jang, J. S.; Joo, K. K.; Jung, D. E.; Kang, S. K.; Kasugai, Y.; Kawasaki, T.; Kim, E. M.; Kim, E. J.; Kim, S. B.; Kim, S. Y.; Kinoshita, H.; Konno, T.; Little, C.; Maruyama, T.; Marzec, E.; Masuda, S.; Meigo, S.; Moon, D. H.; Nakano, T.; Niiyama, M.; Nishikawa, K.; Pac, M. Y.; Park, B. J.; Park, H. W.; Park, J. B.; Park, Jisu; Park, J. S.; Park, R. G.; Peeters, S. J. M.; Rott, C.; Ryu, J. W.; Sakai, K.; Sakamoto, S.; Shima, T.; Shin, C. D.; Spitz, J.; Suekane, F.; Sugaya, Y.; Suzuya, K.; Takeuchi, Y.; Wang, W.; Wei, W.; Yamaguchi, Y.; Yeh, M.; Yeo, I. S.; Yu, I.

doi:10.1088/1748-0221/20/09/P09002

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Muon tagging with flash ADC waveform baselines

Lee, D. H.;
Cheoun, M. K.;
Choi, J. H.;
Choi, J. Y.;
Dodo, T.;
... Park, J. S.;
외 51명

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초록

This manuscript describes an innovative method to tag muons using the baseline information of the Flash ADC (FADC) waveform of PMTs in the JSNS2 (J-PARC Sterile Neutrino Search at J-PARC Spallation Neutron Source) experiment. The experiment is designed to search for evidence of sterile neutrinos, and a reliable method for muon tagging is an essential component for background rejection because the detector is located above ground, on the 3rd floor of the J-PARC Material and Life Science Experimental Facility (MLF). Cosmogenic muons that stop within the detector volume and produce a Michel electron are a particularly important background that must be rejected for our sterile neutrino search. Utilizing this innovative method, more than 99.8 % of Michel electrons can be rejected even without using information from the detector's veto region PMTs. This technique can be employed by any experiments which uses a similar detector configuration.

키워드

Liquid detectors; Particle identification methods; Photoemission

제목: Muon tagging with flash ADC waveform baselines

저자: Lee, D. H.; Cheoun, M. K.; Choi, J. H.; Choi, J. Y.; Dodo, T.; Goh, J.; Harada, M.; Hasegawa, S.; Hwang, W.; Iida, T.; Jang, H. I.; Jang, J. S.; Joo, K. K.; Jung, D. E.; Kang, S. K.; Kasugai, Y.; Kawasaki, T.; Kim, E. M.; Kim, E. J.; Kim, S. B.; Kim, S. Y.; Kinoshita, H.; Konno, T.; Little, C.; Maruyama, T.; Marzec, E.; Masuda, S.; Meigo, S.; Moon, D. H.; Nakano, T.; Niiyama, M.; Nishikawa, K.; Pac, M. Y.; Park, B. J.; Park, H. W.; Park, J. B.; Park, Jisu; Park, J. S.; Park, R. G.; Peeters, S. J. M.; Rott, C.; Ryu, J. W.; Sakai, K.; Sakamoto, S.; Shima, T.; Shin, C. D.; Spitz, J.; Suekane, F.; Sugaya, Y.; Suzuya, K.; Takeuchi, Y.; Wang, W.; Wei, W.; Yamaguchi, Y.; Yeh, M.; Yeo, I. S.; Yu, I.

DOI: 10.1088/1748-0221/20/09/P09002

발행일: 2025-09

유형: Article

저널명: Journal of Instrumentation

권: 20

호: 9

언어: ENG

출판사: IOP Publishing Ltd

발행국가: 영국

ISSN: E 1748-0221
P 1748-0221