Thallium lead iodide (TlPbI3) single crystal inorganic perovskite: Electrical and optical characterization for gamma radiation detection

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초록

TlPbI3 has been suggested as a candidate semiconductor material for room temperature gamma ray and charged particle detection, motivated by its wide bandgap (2.17-2.3 eV), and high density (6.6 gm/cm(3)) required for low noise and high intrinsic detection efficiency. In this work, we studied the optical and electronic properties of Bridgeman-grown TlPbI3 single crystal using ultraviolet-visible-infrared absorption spectroscopy, low temper-ature cathodoluminescence, temperature dependent current-voltage measurements, and charge carriers' mobility-lifetime measurements. The fabricated Ag/TlPbI3/Ag device showed Ohmic behavior in temperatures ranging between-7 degrees C to 22 degrees C and exhibited high resistivity (similar to 2 x 10(11) Omega.cm at RT). Fermi level pinning at 0.72 eV above valence band minimum or below conduction band maximum was calculated from the temperature dependent resistivity measurement, and the 2.17 eV bandgap was determined from ultraviolet-visible-infrared absorption spectroscopy. The cathodoluminescence spectrum of TlPbI3 was resolved to two peaks at 1.45 eV and 1.48 eV indicating deep level traps. The mobility-lifetime product was estimated to be 3.43 x 10(-5) cm(2)/V and 2.29 x 10(-6) cm(2)/V for electrons and holes, respectively. Possible interpretations are presented suggesting the presence of vacancy type defects. Our results provide new essential information for developing such a new class of room temperature radiation detector material for a wide range of applications.

키워드

Perovskites; Radiation detector; Cathodoluminescence; UV-Vis-IR absorption spectroscopy; ELECTRONIC-STRUCTURE; GROWTH
제목
Thallium lead iodide (TlPbI3) single crystal inorganic perovskite: Electrical and optical characterization for gamma radiation detection
저자
Hany, Ibrahim; Yang, Ge; Phan, Quoc Vuong; Kim, Hong Joo
DOI
10.1016/j.mssp.2020.105392
발행일
2021-01
유형
Article
저널명
Materials Science in Semiconductor Processing
권
121